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PXI/PXIe Modular Test and Measurement System: A Robust Solution for High-Precision Testing and Measurement
2026-03-19
The PXI/PXIe modular test and measurement system, with its standardized architecture, outstanding hardware performance, and high degree of customization, has become the preferred solution for both industrial field applications and laboratory settings. Today, we will provide a comprehensive overview of this test and measurement platform, revealing its technical advantages and real-world application scenarios.
The PXI test and measurement system is a modular, standardized test and measurement platform extended from PCI bus technology. Meanwhile, PXIe, as its upgraded version, delivers comprehensive improvements in bus architecture, bandwidth, and synchronization, specifically designed to meet the demands of high-precision, multi-channel, and highly synchronized test and measurement applications. 。
Leveraging open industry standards, flexible scalability, and robust core performance, PXIe test and measurement systems have been widely adopted in a variety of high-precision data acquisition applications, including automated testing, signal measurement, and condition monitoring.
The core of a PXIe test and measurement system consists of three main components: the chassis, the controller, and the peripheral modules. The three components work in seamless synergy to enable end-to-end operations spanning signal transmission, signal acquisition, data processing, and command control, while each module can be selectively configured to meet specific requirements, allowing for the flexible design and deployment of customized systems.
01 Chassis
The system’s “power and communications hub”
The PXI chassis serves as the foundational platform for the system, providing stable power supply, a dedicated cooling solution, and high-speed communication buses. It also supports the integrated installation of multiple instrument modules, features a wide range of slot specifications, and can be adapted to various system form factors, including portable, desktop, rack-mounted, and embedded configurations.
The basic PXI version is based on the PCI parallel bus, making it well suited for fundamental applications such as low-speed data acquisition and low-cost testing. The upgraded PXIe version, built on the PCIe serial bus, delivers significantly enhanced bandwidth and synchronization performance, along with stronger power delivery and thermal management, making it the mainstream choice for high-bandwidth, high-precision testing. PXIe chassis typically feature a hybrid slot configuration, ensuring backward compatibility with PXI modules and software interoperability, thereby significantly reducing upgrade costs.
Saimai Measurement and Control’s PXI chassis are available in various sizes and can be configured with 4 to 21 slots.
02 Controller
The system’s “brain command center”
The system controller slot at the far left of the PXI/PXIe chassis serves as the “brain” of the entire system, responsible for running test software, coordinating the orderly operation of each module, and acting as the core for data processing and command control.
The PXIe embedded controller can be directly installed inside the chassis, eliminating the need for an external PC and providing a compact, high-performance embedded computing solution for test systems. It integrates a high-performance processor, memory, and hard drive, along with standard interfaces such as Ethernet, video, serial ports, and USB. The front panel provides direct access to peripheral interfaces, removing the need to purchase additional interface cards and thereby effectively reducing overall system costs.
Saimai Measurement and Control controllers are suitable for high-performance, high-throughput testing applications.
03 Peripheral module
The system’s “functional execution unit”
PXIe peripheral modules are functional hardware units housed within the chassis and serve as the core execution units for meeting a wide range of test requirements. They include various types such as oscilloscopes, RF transceivers, and signal generators, and can be flexibly configured and freely expanded to suit specific testing needs, enabling rapid deployment of customized measurement systems.
Saimai offers a wide range of PXI/PXIe peripheral modules to meet diverse testing requirements. ：
Such modules do not require redundant control and interface circuits to perform data processing, logic control, and other human–machine interaction tasks. By focusing solely on core functions such as signal transmission, signal acquisition, conditioning, and measurement, the system achieves a substantial reduction in size while maintaining measurement accuracy and operational performance, thereby realizing a seamless integration of high integration and high performance. 。
Its modular design covers a wide range of complex testing scenarios, from basic data acquisition to RF and bus testing, and is broadly applicable to the testing needs of multiple industries, including electronics, automotive, and industrial automation.
What exactly makes PXI/PXIe systems so powerful?
Compared with traditional benchtop test instruments, PXI/PXIe systems, with their modular architecture and specialized hardware design, deliver significant advantages in performance, scalability, and practicality, making them the preferred choice for high-precision testing applications.
The STP8000 series RF test system is a specialized automated test equipment designed for mass-production testing of RF chips. Based on Saimai Measurement & Control’s self-developed core PXI modular instruments and RF-specific instruments. , enabling flexible configuration tailored to different chip types. Below, we present real-world application cases that fully demonstrate its core advantages of flexible adaptability, high efficiency, and reliability:
Scene Requirements
In RF switch production-line testing, it is necessary to simultaneously perform rapid and accurate measurements of multiple parameters across multiple channels, including insertion loss, isolation, switching time, overshoot, leakage current, and MIPI compliance. At the same time, the test system must offer flexible upgradeability to accommodate evolving test requirements.
Technology Implementation
The STP8000-S switch tester is built on the Saimai Measurement & Control PXI platform and configured with modules such as the SNA3308 vector network analyzer, the SPU6151 digital channel instrument, and the RF Port Module, offering flexible module configuration that can be tailored to meet specific test requirements.
The system supports 36 RF ports with frequency coverage from 10 MHz to 8.5 GHz, enabling simultaneous measurement of switch insertion loss and isolation. It delivers outstanding fast-measurement performance and SOLT calibration accuracy. The system natively supports a wide range of tests, including switch time, OS, leakage current, and MIPI compliance, and its modular design facilitates easy system upgrades. It efficiently performs broadband sampling and switch-time testing, meeting the high-efficiency test requirements of production lines.
Scene Requirements
In the production and R&D of high-speed cables, it is essential both to implement rapid in-line inspection to ensure efficiency and to accurately pinpoint product issues arising from factors such as connectors, structural cycles, and cable design during the R&D phase.
The STP8000L consists primarily of the SNA3308 vector network analyzer, a switch matrix, host computer software, and associated accessories. Leveraging a self-developed matrix system and proprietary host software, it delivers industry-leading test speed and accuracy, enabling flexible responses to testing challenges across diverse application scenarios.
Scene Requirements
In wafer-level (CP) testing of filters and multiplexers, high-precision, high-efficiency test solutions are essential to ensure product performance and yield; the STP8000-F filter CP tester is specifically designed for this application.
Technology Implementation
The STP8000-F filter CP test system is independently developed by Saimai Measurement & Control and comprises a 4-port vector network analyzer—the SNA3308—along with RF port modules and a PXI system. Paired with automated test software, it delivers industry-leading test speed and accuracy. In addition, the system architecture is compatible with a wide range of mainstream test instruments, enabling it to meet diverse customer testing requirements across various application scenarios.
From precision testing in the laboratory to efficient diagnostics in industrial settings, PXI/PXIe modular test and measurement systems have emerged as a robust solution for high-accuracy testing and measurement, thanks to their flexible scalability, outstanding core performance, and high degree of customization. As industrial automation and precision manufacturing continue to advance, PXI/PXIe systems will leverage open standards and ongoing technological upgrades to unlock new application opportunities across an expanding range of industries.
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Email: sales@semi-mile.com
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