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High-Power RF Chip Test System

RF Chip High‑Power Test System


Product Overview

The primary purpose of high‑power testing for RF chips is to identify products that do not meet performance requirements through early‑stage screening, while also verifying chip reliability and evaluating long‑term operating life.

The entire system provides high‑power stimulus to RF chips, measures the RF parameter degradation characteristics of chips under high‑power stimulus in real time, and enables capture of transient failure data. This is an important test method for characterizing device performance.

Filter Test System

Filter Test System


System Composition
The RF chip high‑power test system mainly consists of a signal generator, power amplifier, power meter, directional coupler, fixed attenuator, temperature chamber, vector network analyzer, host software, and related accessories. The system supports industry‑mainstream vector network analyzers. With the self‑developed real‑time monitoring system for input and output power and host software, it not only verifies performance under high power but also monitors S‑parameter changes in real time through the network analyzer.
System Block Diagram

System Block Diagram


System Features and Performance
Basic System Characteristics
Frequency range: 0.5 ~ 6 GHz (determined by power amplifier and system hardware)
Stimulus power: Pout ≥ 43 dBm (20W) (determined by power amplifier)
Power accuracy: ≤ ±0.1 dB
Supports CW, pulse, and modulated signals such as LTE/5G NR
Operating time ≥ 1000 hours
Operating environment: laboratory, air‑cooled
Key Features
Self‑designed and developed power amplifier and fully automated control software
Wizard‑guided calibration operation guide for calibrating input and output path loss (gain)
Supports PowerServo function for real‑time dynamic adjustment of stimulus power delivered to the RF chip input
Flexible external software interfaces supporting communication and control with temperature chambers from different manufacturers
Simple system architecture, low cost
Flexible output result definition, supporting custom storage of power log files and network analyzer S‑parameter files
Fully Automated Hardware Connection, Calibration, Testing and Results Display
Instrument Connection

Instrument Connection

Calibration File Import

Calibration File Import

Software Interface

Software Interface

Test Process

STP8000‑S System Composition

Output Calibration File Input Calibration File Test Result File
Output Calibration File Input Calibration File Test Result File
Network Analyzer Calibration and Test Results
Calibration Results

Calibration Results, In‑band Ripple ≤ 0.1 dB

Stimulus Power Test Results

Stimulus Power Test Results (1 GHz high‑power stimulus is applied in the figure, hence the spurious spikes)


Ordering Information
No. Model Qty Description
1 Keysight N5182B 1 Frequency: 9 kHz ~ 6 GHz;
Amplitude: -144 ~ +18 dBm;
Amplitude resolution: 0.01 dB
2 R&S NRP18SN 2 Frequency: 10 MHz ~ 18 GHz;
Power range: -70 dBm ~ +23 dBm
3 R&S ZNB8 1 Frequency: 9 kHz ~ 8.5 GHz
Number of ports: 4
4 Semi‑mile HPG056047 1 Frequency: 500 MHz ~ 6 GHz;
Gain: ≥ 50 dB;
Output power: ≥ 47 dBm;
Input/output VSWR: ≤ 2
5 Semi‑mile SMIX ATE Platform 1 Automated monitoring of input and output power;
Real‑time export of test result log files;
Automatic alarm for filter characteristic degradation;
Timed ON/OFF control of RF signal stimulus
6 Cables, Couplers, Attenuators, Switches and other Accessories Several Semi‑mile Custom
7 Temperature Chamber MT3065 1 Supports communication and control with tester software

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Contact

Website: www.semi-mile.com
Phone: +86 512-68762800

Email: sales@semi-mile.com
Address: Unit A0101, International Science and Technology Park, No.1355 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China.

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