Filter CP Test System
With the development of chip structure and advanced packaging technology, wafer-level testing is becoming more and more important. Compared with traditional finished product testing, wafer-level RF parametric testing puts forward higher requirements for testing solutions in terms of calibration, probes, test accuracy, and result generation.
Semi-mile provides a flexible configuration test solution, has industry-leading UPH, test accuracy and rich delivery experience, and can quickly help customers deploy test systems.
- Support single site and dual site measurement
- Support for importing calibration files
- Support the sampling test of Die in the wafer (sampling ratio: 1/2, 1/4, 1/8, etc.)
- Software low yield alarm
- Support Mapping function, the output results include Mapping(txt)\S parameter file\DAT file\STDF file\test log file, among which STDF file can be parsed into csv file
- Open API, support data upload to MES system