Solution
Rf Chip RF-HTOL Test System
Product Description
The RF chip RF-HTOL test system is a High temperature operating life test system developed by Semi-mile Measurement and Control. The system can realize the functions of high-power excitation and output power detection for RF chip testing.
The system can be applied to reliability analysis, and with high-low temperature chamber and other equipment, it can evaluate the normal working life of the chip for a long time in the future, that is, the estimation of the life cycle of electronic devices.
Product Features
- Self-designed power amplifier, power divider, MFI module and automatic measurement and control software
- Self-developed and controllable core components, flexible customization according to actual needs
- Use an external directional coupler for automatic power detection and alarm
- The system architecture is simple and the cost is relatively low
- 600MHz-3GHz, the output power through the power splitter is ≥40dBm
- 3GHz-6GHz, output power ≥33dBm (depending on customer requirements and RF link loss)
- Amplitude difference between channels ≤±0.5dB
File Download
Name
Last updated time
Size
Obtain information
26-01-20 16:03
3.0MB
Contact
Website: www.semi-mile.com
Phone: +86 512-68762800
Email: sales@semi-mile.com
Address: Unit A0101, International Science and Technology Park, No.1355 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China.
Sweep
Public number
Small programme QR code
Tel：
Email：
WeChat：
在线客服添加返回顶部
屏蔽页面上图片的alt/title提示
右侧在线客服样式 1,2,3 3
图片alt标题设置： Semi-mile
表单验证提示文本： Content cannot be empty!
循环体没有内容时： Sorry, no matching items were found.
CSS / JS 文件放置地