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Rf Chip RF-HTOL Test System
Product Description
The RF chip RF-HTOL test system is a High temperature operating life test system developed by Semi-mile Measurement and Control. The system can realize the functions of high-power excitation and output power detection for RF chip testing.
The system can be applied to reliability analysis, and with high-low temperature chamber and other equipment, it can evaluate the normal working life of the chip for a long time in the future, that is, the estimation of the life cycle of electronic devices.
Product Features
◆ Self-designed power amplifier, power divider, MFI module and automatic measurement and control software
◆ Self-developed and controllable core components, flexible customization according to actual needs
◆ Use an external directional coupler for automatic power detection and alarm
◆ The system architecture is simple and the cost is relatively low
◆ 600MHz-3GHz, the output power through the power splitter is ≥40dBm
◆ 3GHz-6GHz, output power ≥33dBm (depending on customer requirements and RF link loss)
◆ Amplitude difference between channels ≤±0.5dB
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26-01-20 16:03
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Contact
Website: www.semi-mile.com
Phone: +86 512-68762800
Email: sales@semi-mile.com
Address: Unit A0101, International Science and Technology Park, No.1355 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China.
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