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Filter Sorting and Testing Integrated Machine (FT) Test System

   Product Overview

The Semi‑mile integrated system mainly consists of a Vector Network Analyzer, Handler, host software, and related accessories. This system is primarily used in the back‑end production of semiconductor chips, and is an integrated equipment that fully automatically performs multiple functions including chip appearance and dimension inspection, electrical parameter testing, laser marking, mark inspection, sorting and storage, and final tape‑and‑reel packaging output. With the self‑developed host software, it delivers industry‑leading test speed and accuracy.

   Product Features

Integrated hardware and software platform
One‑click test plan import
Industry‑leading UPH
Real‑time data display and export

Flexible compatibility and scalability
Fast equipment deployment and factory delivery

Simplified system setup improves deployment efficiency and cost‑effectiveness

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