Solution
Filter CP Test Machine
STP8000-F Filter CP Tester
Product Overview
The STP8000-F filter CP test system is specifically designed for CP testing of filters and multiplexers. The test system optimizes the traditional test architecture, reduces system complexity, improves signal quality, and delivers superior test performance, ensuring test stability, consistency, and reliability. The tester combines extreme test speed with exceptional cost‑performance, and works with various probe stations to complete filter CP testing.
System Features
- Test sites: supports 1‑4 site configuration
- Frequency range: 10 MHz – 8.5 GHz
- Communication protocols: TTL, GPIB
- Supports flexible configuration of wafer test areas
- Compatible with mainstream calibration kits and self‑developed electronic/mechanical calibration standards
- Flexible virtual matching and de‑embedding via configuration files
- Configurable .snp file save function

System Composition
The STP8000-F filter CP test system consists of the self‑developed 4‑port Vector Network Analyzer SNA3308, the RF Port Module, and the PXI system. Together with the automated test software, it delivers industry‑leading test speed and accuracy. Additionally, the system solution can also accommodate various mainstream test instruments to meet customers' test requirements in different scenarios.
STP8000-F System Composition
Wafer Mapping Tool is a WaferMap editing and wafer test software developed by Semi‑mile, featuring the following functions:
- Automatically generate WaferMap based on wafer and die dimensions
- Generate WaferMap based on wafer and shot dimensions and die relative coordinates
- Automatically identify edge dies and valid dies; customize HomeDie and StartDie
- Select any die, execute tests, and save test results

| Product | Description |
|---|---|
| SNA3308 | 4‑port Vector Network Analyzer, frequency range: 10 MHz – 8.5 GHz |
| RF Port Module | Customizable design |
| PXI Chassis | Chassis series optional |
| PXI Controller | High‑performance embedded controller series optional |
| Test Software | System calibration, testing, and result export |
- Can be configured with various models of handlers according to customer requirements to form an integrated test‑handler solution
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26-08-20 13:43
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