Solution
Filter CP Test System
Product Description
With the development of chip structure and advanced packaging technology, wafer-level testing is becoming more and more important. Compared with traditional finished product testing, wafer-level RF parametric testing puts forward higher requirements for testing solutions in terms of calibration, probes, test accuracy, and result generation.
Semi-mile provides a flexible configuration test solution, has industry-leading UPH, test accuracy and rich delivery experience, and can quickly help customers deploy test systems.
Product Features
- Support single site and dual site measurement
- Support for importing calibration files
- Support the sampling test of Die in the wafer (sampling ratio: 1/2, 1/4, 1/8, etc.)
- Software low yield alarm
- Support Mapping function, the output results include Mapping(txt)\S parameter file\DAT file\STDF file\test log file, among which STDF file can be parsed into csv file
- Open API, support data upload to MES system
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26-01-20 16:01
2.8MB
Contact
Website: www.semi-mile.com
Phone: +86 512-68762800
Email: sales@semi-mile.com
Address: Unit A0101, International Science and Technology Park, No.1355 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China.
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