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Filter/DiFEM Test Machine Filter/DiFEM Test Machine

Filter CP Test Machine Filter CP Test Machine

Switch tester Switch tester

LNA/LNA Bank Test Machine LNA/LNA Bank Test Machine

RF-HTOL Test System for RF Chips RF-HTOL Test System for RF Chips

High-Power RF Chip Test System High-Power RF Chip Test System

High-Speed Cable Test System High-Speed Cable Test System

Filter Sorting and Testing Integrated Machine (FT) Test System Filter Sorting and Testing Integrated Machine (FT) Test System

High-Speed Cable Test System

STP8000L High‑Speed Cable Test System

 
Product Overview 

 

The STP8000L is a high‑speed cable test system developed by Semi‑mile. The system supports mainstream high‑speed digital standard protocols, including PCIe Gen4/Gen5 1X‑16X, Mini SAS HD / Slimline SAS, SFP / SFP+ / SFP28 / SFP56, QSFP+ / QSFP28 / QSFP56 / QSFP‑DD / OSFP, USB3.0 / USB4.0 / TBT3.0 / TBT4.0 / HDMI / DP, high‑speed differential pairs, and more.

This system can be applied not only to rapid production line inspection, but also, with the appropriate options, to problem diagnosis during the R&D phase, such as product issues caused by adapters, structural periodicities, cables, and other factors.

Actual Setup Photo

Actual Setup Photo

 
System Composition 
The STP8000L mainly consists of a vector network analyzer, switch matrix, host software, and related accessories. The system supports industry‑mainstream vector network analyzers (such as Keysight E5071C/E5080B/M980xA, R&S ZNB, ZNA, etc.). With the self‑developed matrix system and host software, it delivers industry‑leading test speed and accuracy.
System Composition

System Composition

 
System Features and Performance 
Switch Matrix Technical Specifications
  • Supports up to 64‑port measurements
  • Guaranteed lifetime of over 2 million cycles
  • Supports 96/128/144 channel expansion
  • Supports electronic calibration kits / mechanical calibration kits
  • Frequency range DC ~ 40 GHz
  • Remote control: RS485, USB
Switch Matrix Topology Diagram

Switch Matrix Topology Diagram

Test Items
Frequency Domain
  • Insertion Loss SDD21/ILV
  • Return Loss SDD11 | SDD22
  • Common‑Differential Return Loss SDC11 | SDC22 | SCD11 | SCD22
  • Common‑Common Return Loss SCC11 | SCC22
  • Common‑Differential Insertion Loss / Mode Conversion SCD21 | SDC21
  • Signal‑to‑Noise Ratio SCD21‑SDD21
  • Crosstalk / Intra‑pair Crosstalk: FEXT | NEXT / MDFEXT / MDNEXT / PSFEXT / PSNEXT
  • Impedance transformation (VNA is a 100 Ohm test system, can be transformed to 85 Ohms for testing)
  • Fixture de‑embedding: supports independent de‑embedding per channel; use the .s4p file provided with the test fixture (2x Thru / 1x Open…) to remove fixture effects from test results
Time Domain
  • Differential Impedance TDD11 | TDD22 | rise time configurable
  • Skew / Intra‑pair Skew / Differential signal pairs skew
  • Differential Delay
Comprehensive
  • ICR/ICN…

(Calculation formulas provided)

Fully Automated Calibration, Testing and Results Display
Calibration

Calibration

Testing

Testing

Results Display

Results Display

Advanced Calibration Technology, Fixture S‑Parameter Extraction and De‑embedding
  • Calibration methods: electronic calibration kits / mechanical calibration kits
  • Supports AFR de‑embedding: requires integration of AFR de‑embedding function in test software, supports batch testing
  • Thru test calibration: calibrate corresponding thru paths, calibrated by channel count
  • Thru de‑embedding (insertion loss de‑embedding, crosstalk de‑embedding selectable; return loss, impedance, etc. not de‑embedded), de‑embedding options selectable
  • Crosstalk calibration: after calibrating thru paths, use de‑embedding method or other methods; manufacturer proposes solution based on own capabilities
  • Supports independent de‑embedding for each channel
  • Calibration accuracy: within 40 GHz, testing thru components, insertion loss deviation less than ±0.2 dB, return loss less than -27 dB
De‑embedding Settings

De‑embedding Settings

 
Ordering Information 
No. Model Qty Description Remarks
1 Semi_Switch_Platform Switch Matrix 1 Loaded switch matrix, 64 channels, expandable to 96/128/144 channels  
2 STP8000L Test Software 1

Test Software

·PCIe Gen4/Gen5 1X / 2X / 4X / 8X

·Mini SAS HD / Slimline SAS

·SFP / SFP+ / SFP28 / SFP56

·QSFP+/QSFP28/QSFP56/QSFP-DD/uQSFP/OSFP

 Software option, permanent license
3 Cables Several Amplitude‑stable / phase‑stable test cables, connecting switch and DUT  
4 Barcode Scanner 1 Automatically loads corresponding information and configuration after scanning, then starts testing  
5 Host PC and Label Printer 1 Reference configuration: Intel i5 11400F processor, 16 GB memory, 256 GB SSD, multiple USB3.0 ports, dual network adapters.
Printer capable of printing labels of various sizes, colors, and fonts; generates barcodes/QR codes from part numbers.		  

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Contact

Website: www.semi-mile.com
Phone: +86 512-68762800

Email: sales@semi-mile.com
Address: Unit A0101, International Science and Technology Park, No.1355 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China.

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