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Invitation | Semi-mile Measurement & Control Invites You to Join Us at the 2026 Shenzhen International Test and Measurement Exhibition—Smartly Paving the Way for the Future!
2026-04-02

In an era of rapid technological iteration and profound industrial transformation worldwide, test and measurement technology—as the core enabler of industry innovation and quality assurance—is poised to seize entirely new opportunities for development.
The 2026 Shenzhen International Exhibition and Conference on Testing and Measurement Technologies and Equipment is set to open with great fanfare. Semi-mile Measurement & Control cordially invites industry peers and both new and existing customers to attend the event, where we will jointly explore the cutting edge of technology and collaboratively forge new opportunities for the industry!

Meeting Details
Date: April 9–11, 2026
Location: Shenzhen Convention & Exhibition Center (Futian)
Booth Number: 8A010
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At this exhibition, Semi-mile Measurement & Control will make a major appearance with its comprehensive suite of solutions built on a domestically developed PXI instrumentation platform.
01
RF radio frequency instrument




SGR RF broadband transceiver, SNA vector network analyzer, FEU/FED microwave frequency converter, RSG RF analog signal source, and multi-function RF tester.
02
General-purpose modular instruments




SMU source-measurement unit, SDS high-speed broadband oscilloscope, SDA high-speed storage module, Avionics Bus series, DMM digital multimeter, and SPU high-speed digital channel instrument.
System Solution
01 Semiconductor Testing

We provide test equipment for semiconductor testing, leveraging high-performance RF instruments to cover chip, module, and device testing that meets 5G and 6G standards. The entire test system can be integrated with sorters to form a comprehensive sort-and-test unit, and, powered by our independently developed host software, delivers industry-leading test speed and accuracy.
02 Antenna Testing

We offer solutions for far-field, near-field, and compact-range test systems. When integrated with PXI chassis, controllers, SGR RF broadband transceivers, SNA vector network analyzers, and broadband frequency converters, these systems enable comprehensive antenna testing in complex environments, facilitating the evaluation of antenna performance and the overall system-level communication performance.
03 High-Speed Cable Testing

This system can be used for cable fault localization during the R&D phase as well as for rapid in-line testing, covering a frequency range from DC to 40 GHz. It supports mainstream high-speed digital standards and protocols, including PCIe Gen4/Gen5 1x–16x, Mini SAS HD/Slimline SAS, SFP/SFP+/SFP28/SFP56, and high-speed differential pairs.
Semi-mile Measurement and Control will bring
Latest Testing Instruments and Solutions Unveiled at the Exhibition
Comprehensive demonstration of technical prowess and product advantages
For multiple fields such as electronic manufacturing, semiconductors, and industrial automation
Provide customized testing solutions
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