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Invitation |Semi-mile Measurement & Control cordially invites you to attend the 2026 Microwave and Millimeter-Wave Technology and Products Exhibition (MWIE2026).
2026-05-07
The 2026 Microwave and Millimeter-Wave Technology and Products Exhibition (MWIE2026) is set to open soon. Semi-mile Measurement & Control will be showcasing its full lineup of domestically produced PXI‑based modular RF test instruments and industry‑specific solutions, and warmly invites you to attend. Booth No. 111 Exchange and discussion.
As a premier event in the microwave, millimeter-wave, and RF fields, MWIE 2026 not only provides enterprises with a high‑quality platform for product showcasing, technology matchmaking, and service exchange, but also offers researchers and engineering professionals an invaluable opportunity to learn from one another and share best practices. We look forward to collaborating with you to explore innovative pathways in microwave and millimeter-wave testing and to jointly drive technological advancement across the industry.
Meeting Details
Date: May 10–11, 2026
Location: Shenzhen International Convention & Exhibition Center, Convention Center
Booth No.: 111
Show Preview
01、 RF radiofrequency instrument
SGR RF broadband transceiver, SNA vector network analyzer, FEU/FED microwave frequency converter, RSG RF analog signal source, and multi‑function RF tester.
02, General-purpose modular instruments
SMU source-measure unit, SDS high-speed broadband oscilloscope, SDA high-speed storage module, avionics bus series, DMM digital multimeter, SPU high-speed digital channel instrument.
System Solution
01. Semiconductor testing
We provide test equipment for semiconductor testing, leveraging high‑performance RF instruments to support the testing of chips, modules, and devices compliant with 5G and 6G standards. The entire test system can be integrated with sorters to form a unified sorting‑and‑testing platform, and, powered by our proprietary host‑computer software, delivers industry‑leading test speed and accuracy.
02. Antenna Testing
We offer solutions for far-field, near-field, and compact-range test systems. Integrated with PXI chassis, controllers, SGR RF broadband transceivers, SNA vector network analyzers, and broadband frequency converters, these systems enable antenna testing in complex environments, facilitating the evaluation of antenna performance and the overall system‑level capabilities of communication systems.
03. High-speed cable testing
This system can be used for cable‑fault localization during the R&D phase and for rapid in‑line testing, covering a frequency range from DC to 40 GHz. It supports mainstream high‑speed digital standards, including PCIe Gen4/Gen5 1×–16×, Mini SAS HD / Slimline SAS, SFP / SFP+ / SFP28 / SFP56, as well as high‑speed differential pairs.
We look forward to seeing you at MWIE 2026.
Using technological exchange as a bridge
Jointly exploring new possibilities in the field of microwave and millimeter-wave testing.
Contact
Website: www.semi-mile.com
Phone: +86 512-68762800
Email: sales@semi-mile.com
Address: Unit A0101, International Science and Technology Park, No.1355 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China.
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