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Saimai Measurement & Control's DiFEM High-Speed Test Solution Based on Proprietary VNA
2025-11-26
In automated testing of DiFEM (Diode-Interposter Front-End Module) RF front-end modules, efficiency and cost remain core customer concerns. Efficiency bottlenecks and cost pressures in traditional solutions have long been industry pain points. Saimei Test & Control's DiFEM testing solution, based on its proprietary multi-port VNA (vector network analyzer), employs breakthrough technology to reconstruct the testing process, achieving a true “win-win” in both testing efficiency and cost control.
Traditional Testing Approach
01 Traditional Approach:
Conventional DiFEM testing typically requires a multiport VNA paired with a MIPI BOX for RF parameter measurement. Testing DC components necessitates adding an SMU, while measuring switching time demands a time-domain measurement module. The increased number and variety of devices not only escalate hardware investment but also require complex synchronization control logic to coordinate multiple devices.
02 Pain Points of Traditional Approach:
• High Cost: Significant expense due to the premium pricing of traditional multiport network analyzers.
• Functional Limitations: Single-purpose instruments necessitate multiple categories of equipment to complete all test items.
• Difficult Scalability: High implementation difficulty for multi-site testing.
SemiTest Solution
01 SemiTest Approach:

SemiTest's proprietary VNA testing solution diagram
SemiTest has launched the STP8000-D Filter/DiFEM Tester. Centered around SemiTest's proprietary SNA3308 network analyzer, it integrates a PPMU and customizable PortModules as its core framework. This solution enables end-to-end testing covering DC+MIPI Function+S-parameters+switching time. Its PXIe communication architecture also facilitates future multi-site expansion.
02 Advantages of the Saimai VNA Solution:
• Built-in Switching Time Testing: No additional instruments required; single-unit completion of time-domain analysis and broadband sampling.
• High-Precision Calibration: Supports multiple calibration methods including SOLT and TRL.
• Flexible Scalability: Modular design supports 1-4 parallel test sites with effortless upgrades.
Solution Architecture: Hardware-Software Synergy for Efficient Closed-Loop Testing
The Saimei VNA solution forms a complete closed-loop workflow from signal input to data output, anchored by “proprietary core equipment + intelligent software systems”:
01 Hardware Core:

• SNA3308: Proprietary VNA delivers high-speed, precise RF parameter measurement.
• STP8000: RF test platform integrating all core hardware.
• PXI System: Modular architecture enables flexible expansion with controlled costs.
02 Software Platform:

• Intelligent Test Software: Provides an intuitive user interface (UI) with permission management support.
• Production Management: Displays real-time UPH (units per hour), runtime, operator (OP) information, batch details, and critical alerts.
• Data Analysis: Robust yield statistics functionality, presenting detailed test data and yield distribution.
• Process Control: Supports complete workflow operations including batch initiation, test start/stop, and batch closure.
• Data Output: Automatically generates CSV reports with detailed test data, relevant SNP files, and factory-required STDF files, with support for automatic file compression upon batch closure.
• MES System Integration: Enables seamless data exchange with factory manufacturing execution systems.
Testing Outcomes: From “Meeting Standards” to “Exceeding Expectations”
For a DiFEM module test, a client's traditional solution slightly exceeded the required testing time threshold. The Saimei VNA solution boosted testing efficiency by over 50%, not only meeting the client's speed requirements but also achieving a dual breakthrough in “speed + stability.”