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Invitation | Semi-mile Measurement & Control cordially invites you to attend the 2026 China‑Made Testing Technology and AI‑Empowered Conference (Shenzhen Session), where we will discuss the future of the industry together!

Invitation | Semi-mile Measurement & Control cordially invites you to attend the 2026 China‑Made Testing Technology and AI‑Empowered Conference (Shenzhen Session), where we will discuss the future of the industry together!

The 2026 National Tour of the Domestic Test Technology and AI‑Empowered Solutions Conference, hosted by the Electronic Measurement and Instruments Branch of the Chinese Institute of Electronics, has successfully concluded its Nanjing stop, with the second leg in Shenzhen set to kick off soon. This year’s event focuses on diverse forms of domestically produced test instruments, scenario‑specific system solutions, intelligent software platforms, and AI‑driven test applications, showcasing cutting‑edge innovations and breakthroughs in China’s independent R&D capabilities in the test and measurement field.

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Technical Sharing | An Analysis of the Core Technologies and Typical Application Scenarios of Vector Signal Transceivers

Technical Sharing | An Analysis of the Core Technologies and Typical Application Scenarios of Vector Signal Transceivers

As technologies such as 5G, Wi‑Fi 7, and vehicle‑to‑everything (V2X) accelerate their deployment, the testing requirements for RF chips and wireless communication equipment are becoming more complex and urgent than ever. While traditional benchtop instruments offer robust functionality, they face significant limitations in system integration, test efficiency, and production‑line scalability. Consequently, achieving high‑precision, high‑bandwidth, and highly integrated RF signal testing within constrained spatial constraints has emerged as a critical focus for both R&D and manufacturing.

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June Exhibition Highlights | Two industry trade shows concluded successfully, with modular RF instruments supporting the localization of high-end equipment.

June Exhibition Highlights | Two industry trade shows concluded successfully, with modular RF instruments supporting the localization of high-end equipment.

In June, Semi-mile Measurement & Control made appearances at both the 2026 Nanjing Domestic Testing Technology and AI-Enabled Conference and the 2026 Wuxi Commercial Aerospace and Space Information Technology Exhibition. The company showcased its full lineup of self-developed PXIe modular RF test instruments at these two major industry events, presenting independently controllable testing solutions. Through in-depth exchanges with aerospace institutes, research universities, and electronic manufacturing enterprises, Semi-mile garnered widespread recognition within the industry.

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Semi-mile Measurement and Control and East China Normal University have jointly established a “Joint Laboratory” and an “Engineer Technology Center,” with the signing and unveiling ceremony held successfully.

Semi-mile Measurement and Control and East China Normal University have jointly established a “Joint Laboratory” and an “Engineer Technology Center,” with the signing and unveiling ceremony held successfully.

On the afternoon of June 24, the signing and unveiling ceremony for the 6G Intelligent Communication Test and Measurement Innovation Joint Laboratory and the 6G Intelligent Communication Test and Measurement Engineer Technology Center—jointly established by the School of Excellence in Engineering and the School of Information and Electronic Engineering at East China Normal University—was successfully held at the headquarters of Suzhou Semi-mile Measurement and Control Technology Co., Ltd. in Suzhou Industrial Park.

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Technical Sharing | Application of Network Analysis Time-Domain Mode in RF Switch Chip Testing

Technical Sharing | Application of Network Analysis Time-Domain Mode in RF Switch Chip Testing

RF switch chips are critical components in wireless communication systems. From the RF front‑end of a mobile phone to the antenna arrays of base stations, the performance of these switches directly impacts signal integrity and overall device power consumption. During mass‑production testing, engineers must verify insertion loss, isolation, and—most crucially—the switching time, which determines how long it takes for the switch to transition between states and directly affects system response speed.

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Contact

Website: www.semi-mile.com
Phone: +86 512-68762800

Email: sales@semi-mile.com
Address: Unit A0101, International Science and Technology Park, No.1355 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China.

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